DESIGN OF SEMICONDUCTOR INTEGRATED CIRCUIT, PRODUCING METHOD AND INSPECTION METHOD THEREOF AND SEMICONDUCTOR INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To provide a technique which unnecessitates an exclusive process for forming a pattern in order to determine storage data of stored ROM, simplifies the process and enables reducing a production cost. SOLUTION: In this design and producing method of semiconductor integrated circuit in which plural semiconductor integrated circuits having the stored ROMs which are different in data to be stored are formed on one sheet of wafer, the ROM pattern is formed by being synthesized with the common pattern among plural semiconductor integrated circuits other than the said pattern.