发明名称 METHOD FOR PREVENTING BUBBLE DEFECTS IN TRENCH OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: To test high-speed operation and to test a combination of many instructions by making a random-number instruction generating means generate a test instruction at random according to a test signal which is inputted from outside. CONSTITUTION: The random-number instruction generating means is composed of an instruction storage means 71 and an instruction selecting means 72 and inputs a test mode signal 133 indicating that a self-test is conducted to an instruction selecting means 72. The instruction selecting means 72 sends information showing which test instruction stored in the instruction storage means 71 is selected as a select signal 73 to the instruction storage means 71 and also outputs the information as an instruction information signal 134. Then the instruction storage means 71 having received the select signal 73 outputs a random test instruction corresponding to the select signal to a line 140. Consequently, high-speed operation can be tested and a combination of many instructions can be tested.
申请公布号 KR20010006956A 申请公布日期 2001.12.07
申请号 KR20000028077 申请日期 2000.05.24
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