| 摘要 |
PROBLEM TO BE SOLVED: To dispense with a self-test circuit, composed of a linear feedback shift register(an LFSR) which is required, in addition to an inspected circuit to reduce a circuit area by dispensing with a built-in data compression circuit for executing a self-test for the inspected circuit, in a semiconductor integrated circuit. SOLUTION: In this test faciliting circuit, the LFSR is composed of scan flip-flops 107 arranged regularly in a scan chain 109, an output value from the inspected circuit 101 are pattern-compressed, and signature is scanned in the scan chain 109 as a pseudo-random number sequence.
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