发明名称 METHOD AND APPARATUS FOR MEASURING PARTICLE SIZE DISTRIBUTION
摘要 PROBLEM TO BE SOLVED: To provide a method and apparatus for measuring particle size distribution capable of measuring a wide range of particle size distribution by together using an image analyzing system and a laser scattering/diffraction system and capable of also measuring a particle shape. SOLUTION: The method and apparatus for measuring particle size distribution has a process for supplying a sample to a measuring region for measuring the particle size distribution of the sample, a first particle size distribution measuring process for measuring the particle size distribution of the sample present in the measuring region on the basis of the image data detected by an image sensor, a second particle size distribution measuring process for measuring the particle size distribution of the sample present in the measuring region by the scattering/diffraction of laser beam, and a particle size distribution synthesizing process for synthesizing the first particle size distribution being the measuring result of the first particle size distribution measuring process and the second particle size distribution being the measuring result of the second particle size distribution measuring process to calculate the particle size distribution of the sample.
申请公布号 JP2001337028(A) 申请公布日期 2001.12.07
申请号 JP20000159415 申请日期 2000.05.30
申请人 NIKKISO CO LTD 发明人 MASUDA YOSHIMICHI;OHATA MANABU
分类号 G01N15/02;(IPC1-7):G01N15/02 主分类号 G01N15/02
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