发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device incorporating an analog/digital converter, which can be tested while a permissible error is set in a short time at a low cost. SOLUTION: An input port 105 receives the upper limit and the lower limit of a error tolerance range for analog/digital conversion. An analog/digital converter 102 applies analog/digital conversion to a received analog voltage and outputs digital data. A propriety discrimination section 103 discriminates whether or not the digital data are included within the error tolerance range. The propriety discrimination result is outputted from an output port 104. Since the configuration of discriminating the propriety taking the tolerable error into account is provided in inside the semiconductor device is this way, the propriety discrimination processing conventionally complicated can be simplified and the test time and the cost can be reduced.
申请公布号 JP2001339304(A) 申请公布日期 2001.12.07
申请号 JP20000158917 申请日期 2000.05.29
申请人 TOSHIBA MICROELECTRONICS CORP;TOSHIBA CORP 发明人 UCHIYAMA KATSUHARU
分类号 G01R31/316;G01R31/28;H01L21/822;H01L27/04;H03M1/10;H03M1/12;(IPC1-7):H03M1/10 主分类号 G01R31/316
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