发明名称 MANUFACTURING METHOD OF THIN-FILM TRANSISTOR
摘要 <p>PROBLEM TO BE SOLVED: To remove nickel from a crystallized silicon film by utilizing the nickel. SOLUTION: In this manufacturing method of a thin-film transistor, a metal element 103 for promoting the crystallization of silicon is introduced to a first amorphous semiconductor film 102, the first amorphous semiconductor film is heated for forming a crystalline semiconductor film 104, a second amorphous semiconductor film 106 containing an element belonging to the 15th family in a periodic table is formed on the crystalline semiconductor film, the crystalline semiconductor film and second amorphous semiconductor film are heated, and the crystalline semiconductor film 104 after heating is used.</p>
申请公布号 JP2001338875(A) 申请公布日期 2001.12.07
申请号 JP20010087240 申请日期 2001.03.26
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI
分类号 G02F1/1368;G09F9/30;H01L21/20;H01L21/322;H01L21/336;H01L27/32;H01L29/786;(IPC1-7):H01L21/20;G02F1/136 主分类号 G02F1/1368
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