发明名称 Semiconductor device having a silicide layer with silicon-rich region and method for making the same
摘要 A semiconductor device includes a substrate; a semiconductor region formed on the substrate; and a silicide layer as a contact layer formed directly contacting the semiconductor region; wherein the silicide layer is made to be rich in silicon while including such a silicon amount that contact resistance is significantly lowered and a method for making a semiconductor device which has the steps of: forming selectively a given conductive type semiconductor region on a substrate; forming a Co-Si alloy layer on the entire surface of the semiconductor region; introducing Si into the entire surface or part of the Co-Si alloy layer; and conducting the thermal treatment of the substrate to react the introduced Si with the Co-Si alloy layer and the Ti-included layer to form a Si-rich silicide layer including such a silicon amount that contact resistance is significantly lowered.
申请公布号 US2001049194(A1) 申请公布日期 2001.12.06
申请号 US20010921882 申请日期 2001.08.06
申请人 NEC CORPORATION 发明人 ODA NORIAKI
分类号 H01L21/28;H01L21/285;H01L21/768;H01L21/8238;H01L27/092;H01L29/45;H01L29/78;(IPC1-7):H01L21/44;H01L21/336 主分类号 H01L21/28
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