发明名称 BANDGAP REFERENCE CIRCUIT AND RELATED METHOD
摘要 The present invention is drawn to a method and a system for creating a sub-1V bandgap reference (BGR) circuit. In particular, a sub-1V BGR circuit is formed comprising a shallow trench isolation (STI) region and a poly silicon region above said STI region. The poly silicon region is formed having a first doped region longer than a second doped region. The poly silicon region as one single structure is adapted to function as a resistor and a diode coupled in series, said structure adapted to generate currents in a feedback loop to generate a BGR voltage. In forming the sub-1V BGR circuit, a silicide blocking mask (already available in the process flow for forming a standard semiconductor device) is used to prevent spacer oxide from forming above the center portion of the poly silicon region. In turn, silicide contacts can be formed away from the center portion of the poly silicon region.
申请公布号 WO0193333(A2) 申请公布日期 2001.12.06
申请号 WO2001US17954 申请日期 2001.06.01
申请人 PHILIPS SEMICONDUCTORS, INC.;KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 MITCHELL, TODD;HALEY, MARK, W.
分类号 H01L21/02;H01L21/8234;H01L27/06 主分类号 H01L21/02
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