| 摘要 |
<p>A method of determining a redundancy solution for a semiconductor memory under test (DUT) having redundant rows and columns is disclosed. The method includes the steps of first testing the DUT in a first environment with a first tester to generate a first fail data set. The first fail data set is then transferred to a second tester where the DUT is test in a second environment to generate a second fail data set. The first and second failure data sets are then merged to create a merged fail data set. A highly optimized redundancy solution is then determined based on the merged fail data set.</p> |
