| 摘要 |
An apparatus is provided for detecting UV radiation and measuring the intensity of such radiation. The apparatus includes a semiconducting photosensitive device capable of detecting and responding to UV radiation wavelengths in the range from about 180 nm to about 360 nm. In particular, the photosensitive device is a photodiode based on silicon carbide semiconducting material having a peak response in the wavelength range of about 240 nm to about 290 nm. The UV sensor exhibits long-term stability, linear output, and low variation of output with respect to environmental temperature fluctuation. |
