发明名称 |
Charge compensation semiconductor device and method of making the same |
摘要 |
Compensation element has a drift path between two active zones and a stack of p- and n-conducting regions (3, 4) and a trough-like trench (2). The drift path is lead around the side surfaces and the base surface of the trench. An Independent claim is also included for the production of a compensation element comprising: (a) inserting a trench (2) into a semiconductor body (1) by anisotropic etching; (b) providing the base surface and the side surfaces with p- and n-conducting layers; (c) removing the layers on the surface of the semiconductor body in a planarizing step; and (d) filling the remaining trench on the layers with an insulating material (5) or silicon. The trench is preferably provided with an oxide filling in addition to the p- and n-conducting regions. The walls of the side surfaces are inclined at 55 degrees . |
申请公布号 |
EP1160871(A2) |
申请公布日期 |
2001.12.05 |
申请号 |
EP20010112152 |
申请日期 |
2001.05.17 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
AHLERS, DIRK, DR.;PFIRSCH, FRANK, DR. |
分类号 |
H01L21/336;H01L29/06;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|