发明名称 |
WORK POLISHING METHOD, WORK HOLDING PLATE AND WORK POLISHING DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a polishing technique for a work controlling polishing allowance of the work circumferential part into a prescribed shape and flattening the whole work surface without being affected by the shape of the work before polishing in polishing the circular work requiring an extremely precise flatness for a semiconductor wafer and the like. SOLUTION: This work holding plate holds the work via a plurality of through holes by vacuum absorption and has a mechanism controlling the pushing force towards the outer circumference of the work holding region in polishing the circular work surface by bringing it in contact with the polishing cloth by a prescribed pushing force. An annular elastic tube 11 having a fluid inlet port 14 is disposed in an annular groove 10 formed along the outer circumference of the work holding region 9 and the tube internal pressure is adjusted so that the pushing force in the circumferential part of the work W abutting on the bottom face of the tube 12 can be controlled. |
申请公布号 |
JP2001334454(A) |
申请公布日期 |
2001.12.04 |
申请号 |
JP20000158437 |
申请日期 |
2000.05.29 |
申请人 |
SHIN ETSU HANDOTAI CO LTD |
发明人 |
KITAGAWA KOJI;MASUMURA HISASHI |
分类号 |
B24B37/005;B24B37/30;H01L21/304 |
主分类号 |
B24B37/005 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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