发明名称 Method for producing a gallium nitride epitaxial layer
摘要 The invention concerns a method for producing a gallium nitride (GaN) epitaxial layer characterised in that it consists in depositing on a substrate a dielectric layer acting as a mask and depositing on the masked gallium nitride, by epitaxial deposit, so as to induce the deposit of gallium nitride patterns and the anisotropic lateral growth of said patterns, the lateral growth being pursued until the different patterns coalesce. The deposit of the gallium nitride patterns can be carried out ex-situ by dielectric etching or in-situ by treating the substrate for coating it with a dielectric film whereof the thickness is of the order of one angstrom. The invention also concerns the gallium nitride layers obtained by said method.
申请公布号 US6325850(B1) 申请公布日期 2001.12.04
申请号 US20000530050 申请日期 2000.07.07
申请人 CENTRE NATIONAL DE LA RECHERCHé SCIENTIFIQUE (CNRS) 发明人 BEAUMONT BERNARD;GIBART PIERRE;GUILLAUME JEAN-CLAUDE;NATAF GILLES;VAILLE MICHEL;HAFFOUZ SOUFIEN
分类号 C30B29/38;C30B25/02;H01L21/20;H01L33/00;H01S5/323;(IPC1-7):C30B25/14 主分类号 C30B29/38
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