发明名称 |
Logic built-in self test |
摘要 |
A BIST method that modifies the scan chain path and scan clocks to allow for distributed BIST test. In this distributed BIST concept, the Linear Feedback Shift Register (LFSR) and the Multiple Input Signature Register (MISR) are combined as an integral part of the scan chain, and each scan cycle is utilized as a test cycle.
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申请公布号 |
US6327685(B1) |
申请公布日期 |
2001.12.04 |
申请号 |
US19990310444 |
申请日期 |
1999.05.12 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
KOPROWSKI TIMOTHY J.;MOTIKA FRANCO |
分类号 |
G01R31/3181;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/3181 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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