发明名称 |
Single event upset (SEU) hardened latch circuit |
摘要 |
A single event upset hardened latch circuit is disclosed. The single event hardened latch circuit includes a first dual-port inverter and a second dual-port inverter. An input is coupled to the first dual-port inverter via a first set of pass gates. The first dual-port inverter is coupled to the second dual-port inverter via a second set of pass gates. The output is connected to the first and second dual-port inverters.
|
申请公布号 |
US6327176(B1) |
申请公布日期 |
2001.12.04 |
申请号 |
US20010844079 |
申请日期 |
2001.04.26 |
申请人 |
SYSTEMS INTEGRATION INC.;BAE SYSTEMS INFORMATION AND ELECTRONIC |
发明人 |
LI BIN;LAWSON DAVID C. |
分类号 |
G11C11/412;(IPC1-7):G11C11/412 |
主分类号 |
G11C11/412 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|