发明名称 Projection exposure method and apparatus
摘要 A projection exposure apparatus exposes a substrate by projecting images of patterns formed on a plurality of masks onto the substrate through a projection system sequentially. At least one part of a first mask-driving system is disposed on one side of the projection system, and moves a first mask in a predetermined plane. A second mask-driving system moves a second mask independently from the first mask, in a plane which is the same as or parallel to that for the first mask. At least one part of the second mask-driving system is disposed on the one side of the projection system. A control system is associated with the first and second mask-driving systems, and controls the first and second mask-driving systems respectively in order to project an image of a pattern formed on the first mask and an image of a pattern formed on the second mask onto the substrate sequentially.
申请公布号 US6327022(B1) 申请公布日期 2001.12.04
申请号 US19990468361 申请日期 1999.12.21
申请人 NIKON CORPORATION 发明人 NISHI KENJI
分类号 G03F7/20;H01L21/027;(IPC1-7):G03B27/42;G03B27/44;G03B27/62 主分类号 G03F7/20
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