| 摘要 |
PROBLEM TO BE SOLVED: To provide an yearly information processing verification method and a semiconductor capable of checking the normal operation of software or the like, when yearly setting information is changed. SOLUTION: Measuring software normally operating is prepared, in a state where yearly information stored in a measuring instrument is set to current yearly information, the measuring software is executed and a measured result is outputted. The measurement is repeated by the required number of times and measuring errors are recorded. Then the yearly information stored in the measuring device is changed to past yearly information. The same measurement is executed under the past yearly information. When the measurement is executed normally, the measurement is discriminated as valid measurement, and when the measurement is completed abnormally, the measurement is discriminated as being an invalid measurement. The measurement result based on the executed past yearly information is compared with the measurement result based on the current yearly information, and when only the yearly information is the past yearly information and there is no difference between the measurement result based on the past yearly information and the measurement result, based on the current yearly information or the difference is within a measurement error range, the measurement is discriminated as valid measurement. The other measurement is discriminated as being an invalid measurement.
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