发明名称 RESIST APPLICATION TREATMENT DEVICE AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide a resist application treatment device and method that can collect unnecessary resist liquid such as the resist liquid that is removed from a wafer for reutilizing when a resist film is to be formed on a substrate such as a semiconductor wafer. SOLUTION: A resist application treatment device 70 is composed of a resist application unit (COT) that is an application treatment part for applying the resist liquid onto the substrate, a collection part 80 that collects the resist liquid that is discharged from the resist application unit (COT), a thickening treatment part 30 that condenses the discharged resist liquid that is stored into the collection part 80, a solvent collection part (thinner collection part) 32 that liquefies the vapor of a volatile solvent that is generated when the discharged resist liquid is subjected to thickening treatment, and a mixing treatment part 40 that mixes a thickening resist liquid that is manufactured at the thickening treatment part 30 with the volatile solvent or new volatile solvent that is manufactured at the solvent collection part 32.
申请公布号 JP2001332474(A) 申请公布日期 2001.11.30
申请号 JP20000151491 申请日期 2000.05.23
申请人 TOKYO ELECTRON LTD 发明人 FUJIMOTO AKIHIRO;KIMURA YOSHIO
分类号 G03F7/16;B05C11/10;B05D3/00;B05D7/00;B05D7/24;H01L21/027 主分类号 G03F7/16
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