发明名称 HIGH-IMPEDANCE MEASURING DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To make performable measurement without affecting an on-line state even during communications concerning a resistance measuring device capable of specifying both the cause of oxide film wire breakage which has been conventionally difficult to find and a causal section when an on-line stop and error occur. SOLUTION: By inserting a choke coil 3 in a conventional resistance measuring device 1, it is possible to measure a synthetic resistance without the need for breaking the wire of a communication line 7 and specify a section of oxide film wire breakage in this high-impedance measuring device.</p>
申请公布号 JP2001330633(A) 申请公布日期 2001.11.30
申请号 JP20000193557 申请日期 2000.05.23
申请人 TAKEUCHI TSUTOMU 发明人 TAKEUCHI TSUTOMU
分类号 G01R27/02;H04B3/46;(IPC1-7):G01R27/02 主分类号 G01R27/02
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