发明名称 SEMICONDUCTOR INTEGRATED DEVICE, METHOD FOR DETECTING VOLTAGE DROP OF INTEGRATED CIRCUIT, AND METHOD FOR CORRECTING VOLTAGE DROP
摘要 <p>PROBLEM TO BE SOLVED: To detect and appropriately correct drop of a power-source voltage in an integrated circuit. SOLUTION: There are provided a detection cell 4 at a specified position on a power-source line 3 in a semiconductor integrated device 10 and detects a power-source voltage at the position, a detection circuit 7 for detecting, a drop of the power-source voltage detected by the detection cell 4, and a connection wiring 6 which connects the detection cell 4 to the detection circuit 7 and outputs the power-source voltage detected by the detection cell 4 to the detection circuit 7.</p>
申请公布号 JP2001332699(A) 申请公布日期 2001.11.30
申请号 JP20000155300 申请日期 2000.05.25
申请人 MITSUBISHI ELECTRIC CORP 发明人 TAKABAYASHI TSUTOMU;KONO KENJI;MORISANE SHIZUO
分类号 G06F1/28;H01L21/82;H01L21/822;H01L27/04;H03K5/159;H03K5/19;(IPC1-7):H01L27/04 主分类号 G06F1/28
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