发明名称 |
SEMICONDUCTOR INTEGRATED DEVICE, METHOD FOR DETECTING VOLTAGE DROP OF INTEGRATED CIRCUIT, AND METHOD FOR CORRECTING VOLTAGE DROP |
摘要 |
<p>PROBLEM TO BE SOLVED: To detect and appropriately correct drop of a power-source voltage in an integrated circuit. SOLUTION: There are provided a detection cell 4 at a specified position on a power-source line 3 in a semiconductor integrated device 10 and detects a power-source voltage at the position, a detection circuit 7 for detecting, a drop of the power-source voltage detected by the detection cell 4, and a connection wiring 6 which connects the detection cell 4 to the detection circuit 7 and outputs the power-source voltage detected by the detection cell 4 to the detection circuit 7.</p> |
申请公布号 |
JP2001332699(A) |
申请公布日期 |
2001.11.30 |
申请号 |
JP20000155300 |
申请日期 |
2000.05.25 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
TAKABAYASHI TSUTOMU;KONO KENJI;MORISANE SHIZUO |
分类号 |
G06F1/28;H01L21/82;H01L21/822;H01L27/04;H03K5/159;H03K5/19;(IPC1-7):H01L27/04 |
主分类号 |
G06F1/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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