发明名称 SEMICONDUCTOR MEMORY DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To enable a fine memory cell to be designed by eliminating mask shift (alignment shift) to a field oxide film. SOLUTION: The semiconductor memory device has a tapered field oxide film 31 formed on a semiconductor substrate, and a reversely tapered floating gate 32 which is formed between the tapered field oxide films 31 on a semiconductor substrate.
申请公布号 JP2001332637(A) 申请公布日期 2001.11.30
申请号 JP20000151694 申请日期 2000.05.23
申请人 NEC CORP 发明人 SAITO KENJI
分类号 H01L21/28;H01L21/8247;H01L27/115;H01L29/423;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 H01L21/28
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