发明名称 OPERATION ABNORMALITY ANALYZING DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide an operation abnormality analyzing device capable of easily judging a specific phenomenon by performing analysis by using plural data in the same timing. SOLUTION: A data collecting part 3 cyclically collects the data of a plant under a collection condition set by a collection data setting part 2, and stores the collected data in a collected data file group 4, and when the abnormality of the plant is generated, the data of the collected data file group 4 are retrieved according to a trigger condition set by a trigger condition setting part 7 and a retrieval period set by a retrieval period setting part 14, and extracts plural data in the same timing, and allows a CRT display 12 to display and compare the plural data. Thus, it is possible to perform analysis.</p>
申请公布号 JP2001331221(A) 申请公布日期 2001.11.30
申请号 JP20000147160 申请日期 2000.05.19
申请人 MITSUBISHI ELECTRIC CORP 发明人 HIGATA HIROAKI
分类号 G06Q50/04;G05B23/02;G06F17/40;G06Q50/00;(IPC1-7):G05B23/02;G06F17/60 主分类号 G06Q50/04
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