ARRAY SUBSTRATE INSPECTING METHOD

摘要

PROBLEM TO BE SOLVED: To easily detect off-leak failures in ASWs in array boards which constitute a liquid crystal panel. SOLUTION: After bringing the ASW 1-n into a nonconducting state by two types of OFF-state voltages Vgs with different voltage values and holding signals for test written in auxiliary capacitances 13 for a predetermined time, the written signals for test are each read, and signal waveforms obtained from the two signals for test are compared with each other to facilitate the determination of the presence or absence of off-leak failures and classification.