发明名称 CAPACITANCE ELEMENT, MANUFACTURING METHOD THEREOF, AND MICROWAVE SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE COMPRISING THE SAME
摘要 PROBLEM TO BE SOLVED: To make small loss, small size, and high reliability compatible for an MIM capacitor while manufacturing process is simplified. SOLUTION: An effective width W in the direction vertical to signal propagation direction (a) or (b) and an effective length L in the direction parallel to the signal propagation of an MIM capacitor 5 are so set as to correspond to a desired value of a resistive component, resulting in reduced loss. A sufficient reliability is provided even with a thinner dielectrics film by reducing the thickness of a lower-part capacitance electrode 2a. With a thinner dielectrics film, a sufficient capacitance is provided even if an area is reduce for small size.
申请公布号 JP2001332690(A) 申请公布日期 2001.11.30
申请号 JP20000151650 申请日期 2000.05.23
申请人 SHARP CORP 发明人 FURUKAWA MOTOKO
分类号 H01L27/04;H01L21/822;(IPC1-7):H01L27/04 主分类号 H01L27/04
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