DEVICE AND METHOD FOR COMPUTING TEMPORAL DETERIORATION MARGIN QUANTITY OF LSI AND DETECTION METHOD FOR LSI

摘要

PROBLEM TO BE SOLVED: To easily find a temporal deterioration margin quantity while taking temporal deterioration into consideration and to enable proper inspection taking the temporal deterioration into consideration. SOLUTION: A delay deterioration rate prediction part 101 outputs signal- path-delay-before-deterioration information 302 and signal-path-delay- deterioration-rate information 303 as to each signal path according to LSI design information and a delay-to-delay-deterioration-rate analysis part 102 outputs delay-to-delay-deterioration-rate relation information 304 showing the correlation between delay and delay deterioration rate according to them; and a delay deterioration rate extraction part 103 extracts the delay deterioration rate of a specific signal path and outputs it as a delay deterioration margin 305 and a delay deterioration margin quantity calculation part 104 calculates a delay deterioration margin quantity by using the delay deterioration margin 305 as a derating factor G. An inspection operating frequency calculation part 105 calculates an operating frequency for inspection by using the delay deterioration margin 305 as the derating factor G.