发明名称 INSPECTION METHOD AND INSTRUMENT FOR CYCLIC PATTERN
摘要 PROBLEM TO BE SOLVED: To facilitate the examination of a deviation in area between patterns of a specimen having cyclic patterns. SOLUTION: A specimen having cyclic patterns is photographed to input a pattern image (step 1), an area is measured for each of the patterns of the pattern image (step 2), the areas obtained are each converted to a luminance value to generate an area image with the values arranged (step 3), an intensified image is generated by a processing of intensifying the area image (step 4), the image undergoes a binary coding to generate a judging image (step 5) and then, examination is carried out based on the judging image.
申请公布号 JP2001330419(A) 申请公布日期 2001.11.30
申请号 JP20000149332 申请日期 2000.05.22
申请人 DAINIPPON PRINTING CO LTD 发明人 SOEDA MASAHIKO;NISHIDA MASASHI;OKAZAWA ATSUSHI;CHINJU TAKUTETSU
分类号 G01B11/28;G01N21/956;G02F1/13;(IPC1-7):G01B11/28 主分类号 G01B11/28
代理机构 代理人
主权项
地址