发明名称 LASER ANNEALING METHOD AND METHOD OF MANUFACTURING THIN FILM TRANSISTOR
摘要 <p>PROBLEM TO BE SOLVED: To provide an apparatus and method for manufacturing polycrystalline silicon for a thin film transistor device for use in a liquid crystal display pixel switch on a mass production basis with a good yield. SOLUTION: In the laser annealing apparatus and the method for manufacturing a thin film transistor wherein a pulse laser beam irradiates a glass substrate having an amorphous silicon semiconductor thin film deposited thereon while moving the glass substrate to thereby form a polycrystalline silicon semiconductor; a laser beam L to irradiate glass substrate O has a rectangular cross-sectional shape, the central line of the beam in its longitudinal direction is tilted by an angleθwith respect to a straight line defined by arranging zones corresponding to pixels of the glass substrate to be moved, thereby providing polycrystalline silicon having a uniform grain size.</p>
申请公布号 JP2001332493(A) 申请公布日期 2001.11.30
申请号 JP20000148393 申请日期 2000.05.19
申请人 TOSHIBA CORP 发明人 NAKAMURA ATSUSHI;MIHASHI HIROSHI
分类号 G02F1/136;G02F1/1368;G09F9/00;H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L21/20 主分类号 G02F1/136
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