发明名称 FAULT INFORMATION TRACING DEVICE FOR INTEGRATED SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide an integrated system fault information tracing device, capable of informing of the details of fault occurrence by the history information of a system program and smoothly analyzing the cause of a fault. SOLUTION: A testing device 1 in the fault information tracing device 10 is constituted of an execution format program 11, an execution history collection part 12 for forming history information, a trace memory 13 for storing the history information, and a debugging monitor 14 for making the contents stored in the memory 13 dumped to a device to be tested 2. The device to be tested 2 is constituted of debugger soft 21 for introducing the history information, a trace memory dumped result file 22 filing the history information, a source file group 23 for the program 11, and a trace information analysis program 24 for outputting a corresponding position for fault analysis.
申请公布号 JP2001331344(A) 申请公布日期 2001.11.30
申请号 JP20000151812 申请日期 2000.05.23
申请人 NEC CORP;NEC COMMUN SYST LTD 发明人 YOSHIKAWA KENJI;MIYAMOTO TAKESHI
分类号 G06F11/28;(IPC1-7):G06F11/28 主分类号 G06F11/28
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