| 摘要 |
PROBLEM TO BE SOLVED: To provide a circuit board inspecting method capable of shortening the inspection time and improving the reliability of the results of inspection. SOLUTION: In the circuit board inspecting method, the characteristic impedance of a conductor pattern 21 formed in a circuit board P is obtained, and the GO/NO-GO of the circuit board P is inspected on the basis of the obtained characteristic impedance. With one end 21b of the conductor pattern 21 open, the conductance value and capacitance value between the other end 21a of the conductor pattern 21 and a reference potential 22a are measured. With the one end 21b of the conductor pattern 21 short-circuited to a reference potential 22b, the resistance value and inductance value between both ends of the conductor pattern 21 are measured. The characteristic impedance of the conductor pattern 21 is obtained on the basis of each measured value.
|
