| 摘要 |
A method and apparatus for using weighted random patterns in a partial scan test. A computer generates deterministic patterns (304) on the partial scan design. Deterministic patterns that have the same number of capture clocks between adjacent scan loads are grouped together into pattern groups (308). A computer then determines a set of weights corresponding to each of the pattern groups (312). A tester then uses these weights as a filter to weighted random test patterns and applies these filtered weighted random test patterns along with the appropriate number of capture clock pulses to a device under test. |
