发明名称 Semiconductor device having self-aligned contact and fabricating method therefor
摘要 A semiconductor device having a self-aligned contact and a method for fabricating the same are provided. The semiconductor device includes a plurality of conductive patterns formed to be adjacent to one another by sequentially stacking and patterning a first conductive layer and a mask layer on a particular underlying layer. A first insulation layer fills a gap between adjacent conductive layer patterns such that the upper portion of each conductive layer pattern is exposed. A second insulation layer having a spacer shape is formed on the sides of each conductive layer pattern exposed above the first insulation layer. A second conductive layer fills a contact hole which is self-aligned with respect to the second insulation layers between adjacent conductive layer patterns and passes through the first insulation layer.
申请公布号 US2001045666(A1) 申请公布日期 2001.11.29
申请号 US20000731385 申请日期 2000.12.06
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM MYEONG-CHEOL;NAM BYEONG-YUN;MIN GYUNG-JIN;AHN TAE-HYUK
分类号 H01L21/28;H01L21/60;H01L21/768;H01L23/485;H01L23/522;(IPC1-7):H01L23/48;H01L23/52;H01L29/40 主分类号 H01L21/28
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