发明名称 |
Semiconductor device having self-aligned contact and fabricating method therefor |
摘要 |
A semiconductor device having a self-aligned contact and a method for fabricating the same are provided. The semiconductor device includes a plurality of conductive patterns formed to be adjacent to one another by sequentially stacking and patterning a first conductive layer and a mask layer on a particular underlying layer. A first insulation layer fills a gap between adjacent conductive layer patterns such that the upper portion of each conductive layer pattern is exposed. A second insulation layer having a spacer shape is formed on the sides of each conductive layer pattern exposed above the first insulation layer. A second conductive layer fills a contact hole which is self-aligned with respect to the second insulation layers between adjacent conductive layer patterns and passes through the first insulation layer.
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申请公布号 |
US2001045666(A1) |
申请公布日期 |
2001.11.29 |
申请号 |
US20000731385 |
申请日期 |
2000.12.06 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM MYEONG-CHEOL;NAM BYEONG-YUN;MIN GYUNG-JIN;AHN TAE-HYUK |
分类号 |
H01L21/28;H01L21/60;H01L21/768;H01L23/485;H01L23/522;(IPC1-7):H01L23/48;H01L23/52;H01L29/40 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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