发明名称 Single deposition layer metal dynamic random access memory
摘要 A system and method for forming a memory having at least 16 megabits (224 bits) and only a single deposition layer of highly conductive interconnects. The resulting semiconductor die or chip fits within existing industry-standard packages with little or no speed loss over previous double metal deposition layered DRAM physical architectures. This is accomplished using a die orientation that allows for a fast single metal speed path. The architecture can be easily replicated to provide larger size memory devices. In addition, a method is described for reducing parasitic resistance in an n-sense amplifier.
申请公布号 US2001046148(A1) 申请公布日期 2001.11.29
申请号 US20010790425 申请日期 2001.02.21
申请人 MICRON TECHNOLOGY, INC. 发明人 MERRITT TODD A.
分类号 G11C5/02;H01L27/108;(IPC1-7):G11C5/02 主分类号 G11C5/02
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