发明名称 SEMICONDUCTOR STRUCTURES
摘要 A semiconductor structure, e.g., a high electron mobility transistor structure, is formed by using metamorphic growth and strain compensation. The structure includes a substrate (12), a graded layer (14) over the substrate, a first donor/barrier layer (18) over the graded layer, and a channel layer (24) over the first donor/barrier layer. The substrate (12) has a substrate lattice constant, and the graded layer (14) has a graded lattice constant. The graded layer (14) has a first lattice constant near a bottom of the graded layer substantially equal to the substrate lattice constant and a second lattice constant near a top of the graded layer different than the first lattice constant. The first donor/barrier (18) layer has a third lattice constant, and the channel layer (24) has a fourth lattice constant. The second lattice constant is intermediate the third and fourth lattice constants.
申请公布号 WO0191188(A2) 申请公布日期 2001.11.29
申请号 WO2001US40379 申请日期 2001.03.26
申请人 RAYTHEON COMPANY 发明人 HOKE, WILLIAM, E.;LEMONIAS, PETER, J.;KENNEDY, THEODORE, D.
分类号 H01L29/201;H01L21/20;H01L21/205;H01L21/285;H01L21/335;H01L21/338;H01L29/205;H01L29/778;H01L29/812 主分类号 H01L29/201
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