Test pattern and strobe signal generator used in semiconductor test system, has delay insertion unit that inserts delay to time control data of specified event and duplicating unit for time control and event data

摘要

The test pattern and strobe signal generator has an event memory that stores time control data and event data for every event. A delay insertion unit inserts delay into the time control data of a specified event, such that the total delay of the present event is longer. A duplicating unit duplicates the time control data and event data for the event directly preceding the specified event. An Independent claim is also included for the insertion of delay in time control data of events in testing semiconductor components.