发明名称 Magnetic detection of short circuit defects in plate structure
摘要 Short circuit detection is performed on a plate structure (10) in which a group of first electrical conductors (32) are nominally electrically insulated from, and cross, a group of second electrical conductors (48). In particular, a magnetic current-sensing operation is performed on at least part of the conductors to produce current data indicative of how much, if any, current flows through each of at least part of the conductors. The current data is then examined to determined whether there appears to be a short circuit defect at any location where one of the first conductors crosses one of the second conductors.
申请公布号 US6323653(B1) 申请公布日期 2001.11.27
申请号 US20000539192 申请日期 2000.03.30
申请人 CANDESCENT TECHNOLOGIES CORPORATION 发明人 FIELD JOHN E.;OBERG STEPHANIE J.
分类号 G01R15/20;G09G3/00;H01J9/42;(IPC1-7):G01R31/28 主分类号 G01R15/20
代理机构 代理人
主权项
地址