Application specific automated test equipment system for testing integrated circuit devices in a native environment

摘要

An application specific automated test equipment system for source synchronous bus interface devices is described. A native interface board is provided to interface an automated test unit and a device under test. The native interface board is configured with devices selected to recreate a native environment of the device under test. A first clock drives the devices on the native interface board. A second clock drives the device under test. The second clock signal is derived from the first clock signal to form a substitute clock signal that can be adjusted in relation to the first clock signal. Input and output timing relationships of the device under test are determined by altering the arrival time of the substitute clock at the device under test with respect to the timing of the first clock signal.