发明名称 Post plasma ashing wafer cleaning formulation
摘要 A semiconductor wafer cleaning formulation for use in post plasma ashing semiconductor fabrication comprising the following components in the percentage by weight ranges shown:In the preferred embodiment the chelating agent is catechol (1,2-dihydroxybenzene) and the polar organic solvent is gamma butyrolactone (BLO).
申请公布号 US6323168(B1) 申请公布日期 2001.11.27
申请号 US19960675500 申请日期 1996.07.03
申请人 ADVANCED TECHNOLOGY MATERIALS, INC. 发明人 KLOFFENSTEIN THOMAS J.;FINE DANIEL N.
分类号 C11D7/26;C11D7/28;C11D7/32;C11D7/34;C11D7/50;C11D11/00;G03F7/42;H01L21/02;H01L21/306;H01L21/311;H01L21/3213;(IPC1-7):C11D3/20 主分类号 C11D7/26
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