发明名称 Gate etch process for 12 inch wafers
摘要 A method for fabricating a stacked gate array on a semiconductor 12 inch wafer uses a reaction chamber with an upper inductive means and a lower capacitive means. For etching 12 inch wafers the etching parameters are adjusted to values optimised for etching an 8 inch wafer. In particular the power of the upper inductive means is set to a value between 50 and 600 Watts. <IMAGE>
申请公布号 EP1156519(A1) 申请公布日期 2001.11.21
申请号 EP20000110456 申请日期 2000.05.16
申请人 INFINEON TECHNOLOGIES SC300 GMBH & CO. KG 发明人 MORGENSTERN, THOMAS;GREWAL, VIRINDER
分类号 H01L21/28;H01L21/3213 主分类号 H01L21/28
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