发明名称 Portable high resolution scanning electron microscope column using permanent magnet electron lenses
摘要 A detachable, portable SEM column that is easily disconnected from the electron gun assembly and specimen chamber of the system, allowing different column designs to be used in a given SEM system. As an alternate design, the electron gun and column are configured as a single detachable, portable assembly. The column of the present invention contains a condenser lens and an objective lens, both designed employing permanent magnet elements for primary field generation. Relatively small coils are used for scanning and precise adjustment of focus.
申请公布号 US6320194(B1) 申请公布日期 2001.11.20
申请号 US20000563117 申请日期 2000.05.02
申请人 INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING 发明人 KHURSHEED ANJAM;PHANG JACOB CHEE HONG;THONG JOHN THIAM LEONG
分类号 H01J37/14;H01J37/28;(IPC1-7):H01J37/18 主分类号 H01J37/14
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