发明名称 Metallization process of semiconductor device
摘要 A metallization process of a semiconductor device is disclosed. The metallization process of a semiconductor device comprising the steps of: providing a semiconductor substrate having a junction region; forming an insulating layer on the upper of the semiconductor substrate; forming a contact hole by patterning the insulating layer so as to expose one portion of the junction region; forming a glue layer on the upper of the insulating layer, and at the bottom and inner surfaces of the contact hole; forming a barrier metal layer on the glue layer; forming an Mg layer as a solid solution layer on the barrier metal layer; forming a metal layer on the Mg layer; and forming a metal wiring layer having more liquidity than that of the metal layer, by melting the Mg layer to the metal.
申请公布号 US6319825(B1) 申请公布日期 2001.11.20
申请号 US19990310820 申请日期 1999.05.12
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 JUNG BYUNG HYUN;AHN HEUI BOK
分类号 H01L21/768;H01L23/485;H01L23/532;(IPC1-7):H01L21/476 主分类号 H01L21/768
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