发明名称 |
Metallization process of semiconductor device |
摘要 |
A metallization process of a semiconductor device is disclosed. The metallization process of a semiconductor device comprising the steps of: providing a semiconductor substrate having a junction region; forming an insulating layer on the upper of the semiconductor substrate; forming a contact hole by patterning the insulating layer so as to expose one portion of the junction region; forming a glue layer on the upper of the insulating layer, and at the bottom and inner surfaces of the contact hole; forming a barrier metal layer on the glue layer; forming an Mg layer as a solid solution layer on the barrier metal layer; forming a metal layer on the Mg layer; and forming a metal wiring layer having more liquidity than that of the metal layer, by melting the Mg layer to the metal.
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申请公布号 |
US6319825(B1) |
申请公布日期 |
2001.11.20 |
申请号 |
US19990310820 |
申请日期 |
1999.05.12 |
申请人 |
DONGBU ELECTRONICS CO., LTD. |
发明人 |
JUNG BYUNG HYUN;AHN HEUI BOK |
分类号 |
H01L21/768;H01L23/485;H01L23/532;(IPC1-7):H01L21/476 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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