发明名称 Method of fabricating barrier layer
摘要 A method of forming a barrier layer is described. A dielectric layer is formed on a substrate. The dielectric layer comprises an opening exposing a portion of the substrate. A metallic layer, which is conformal to the opening, is formed on the dielectric layer. A first metallic nitride layer, which is conformal to the opening, is formed on the first metallic layer by chemical vapor deposition. The second metallic nitride layer, which is conformal to the opening, is formed on the first metallic nitride layer.
申请公布号 US6319826(B1) 申请公布日期 2001.11.20
申请号 US19990267875 申请日期 1999.03.11
申请人 UNITED MICROELECTRONICS CORP. 发明人 CHEN MING-SHING;KUO YUNG-CHIEH
分类号 H01L21/768;(IPC1-7):H01L21/44;H01L21/476 主分类号 H01L21/768
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