发明名称 FERROELECTRIC STORAGE DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a ferroelectric storage device in which a writing voltage can be decreased. SOLUTION: A semiconductor region is demarcated on the surface of a substrate. A source region and a drain region are arranged on both sides of a channel region in the semiconductor region. The channel region is covered with a gate insulating film. A floating gate electrode is arranged on the gate insulating film. A ferroelectric film is arranged on the floating gate electrode, and in contact with a region except a region in the vicinity of outer periphery out of an upper surface of the floating gate electrode. A control gate electrode is arranged on the ferroelectric film.
申请公布号 JP2001320028(A) 申请公布日期 2001.11.16
申请号 JP20000133093 申请日期 2000.05.02
申请人 FUJITSU LTD 发明人 AOKI MASAKI
分类号 H01L21/8247;H01L21/8242;H01L27/10;H01L27/108;H01L29/788;H01L29/792;(IPC1-7):H01L27/10;H01L21/824 主分类号 H01L21/8247
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