发明名称 INSPECTION APPARATUS FOR DISPLAY PANEL BOARD
摘要 PROBLEM TO BE SOLVED: To provide an inspection apparatus by which a display panel board can be inspected in a short time without moving the display panel board and a probe unit complicatedly. SOLUTION: The inspection apparatus is used to inspect a plurality of display panel boards formed in rows in a first direction and a second direction in which a plurality of display panel parts cross each other. The inspection apparatus uses the probe unit which comprises a plurality of contactors coming into contact with electrode parts on the panel boards received by a work table as a plurality of contactors corresponding individually to the electrode parts installed on the display panel parts, at least in one row portion, which are aligned in the first direction. When the probe unit and the work table are moved relatively to the second direction, the display panel parts at least in each row can be inspected.
申请公布号 JP2001318116(A) 申请公布日期 2001.11.16
申请号 JP20000138494 申请日期 2000.05.11
申请人 MICRONICS JAPAN CO LTD 发明人 HASEGAWA YOSHIE
分类号 G01R1/06;G01R31/02;G01R31/28;G02F1/13;G02F1/1345;G09F9/00;(IPC1-7):G01R31/02;G02F1/134 主分类号 G01R1/06
代理机构 代理人
主权项
地址