发明名称 |
ALIGNER, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, SEMICONDUCTOR MANUFACTURING PLANT, AND METHOD OF MAINTAINING ALIGNER |
摘要 |
PROBLEM TO BE SOLVED: To eliminate warm-up time and periodic maintenance for oxygen concentration measurement, to reduce power dissipation for oxygen concentration measurement, and to prevent bad influence due to the heat generated by oxygen concentration measuring means. SOLUTION: In an aligner having oxygen concentration measuring means for measuring the oxygen concentration in the optical path for the exposing light, the oxygen concentration measuring means 2-6 measure the oxygen concentration by measuring the drop of the exposing light 7 by oxygen. |
申请公布号 |
JP2001319868(A) |
申请公布日期 |
2001.11.16 |
申请号 |
JP20000138531 |
申请日期 |
2000.05.11 |
申请人 |
CANON INC |
发明人 |
FUKUDA ISAO;NAKAMURA HAJIME |
分类号 |
G03F7/20;H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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