发明名称 ALIGNER, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, SEMICONDUCTOR MANUFACTURING PLANT, AND METHOD OF MAINTAINING ALIGNER
摘要 PROBLEM TO BE SOLVED: To eliminate warm-up time and periodic maintenance for oxygen concentration measurement, to reduce power dissipation for oxygen concentration measurement, and to prevent bad influence due to the heat generated by oxygen concentration measuring means. SOLUTION: In an aligner having oxygen concentration measuring means for measuring the oxygen concentration in the optical path for the exposing light, the oxygen concentration measuring means 2-6 measure the oxygen concentration by measuring the drop of the exposing light 7 by oxygen.
申请公布号 JP2001319868(A) 申请公布日期 2001.11.16
申请号 JP20000138531 申请日期 2000.05.11
申请人 CANON INC 发明人 FUKUDA ISAO;NAKAMURA HAJIME
分类号 G03F7/20;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/20
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