发明名称 CLASSIFIED PARTICLE MEASURING DEVICE, CLASSIFIED PARTICLE MEASURING METHOD, MICRO MASS MEASURING DEVICE AND MICRO MASS MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To solve the problem that measurement on an optional place at an optional time is difficult when requiring measurement of particles floating in space. SOLUTION: While a jet nozzle plate 12b is faced to an impact plate 16, the outside air is sucked at a prescribed flow velocity by a blower 13. While particles are classified by perforated jet nozzle collision classification, the impact plate 16 itself is floating-supported, and an oscillation frequency is measured to measure the mass. Therefore, the formation is simplified and the particle measurement can be executed in an optional environment.
申请公布号 JP2001318044(A) 申请公布日期 2001.11.16
申请号 JP20000132274 申请日期 2000.05.01
申请人 OHM DENKI KK 发明人 OKAZAKI TADAO
分类号 G01N15/02;G01N5/02;(IPC1-7):G01N15/02 主分类号 G01N15/02
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