发明名称 APPARATUS OR METHOD FOR MEASUREMENT OF ELECTROMAGNETIC FIELD AND MANUFACTURING METHOD FOR ELECTRONIC COMPONENT OR ELECTRONIC DEVICE USING IT
摘要 PROBLEM TO BE SOLVED: To estimate an electric field or a magnetic field at a desired distance from an electric field or a magnetic field which is measured near an apparatus without using an anechoic chamber or the like. SOLUTION: A distance from an electronic apparatus as an object to be measured is designated as r, a measuring wavelength is designated asλ, and the effective maximum dimensions of a measuring apparatus are designated as D. The electric field or the magnetic field is measured in a plurality of points inside a region which satisfies r>λ/2πand r<2D2/λ. A maximum value is detected, or a plurality of wave sources are calculated backwards, and a far field is measured.
申请公布号 JP2001318112(A) 申请公布日期 2001.11.16
申请号 JP20000142291 申请日期 2000.05.10
申请人 HITACHI LTD 发明人 TORIGOE MAKOTO;SUGA TAKU;KAMISAKA KOICHI;YAMAMURA HIDEO;TAKAHASHI YASUNOBU
分类号 G01R29/08;(IPC1-7):G01R29/08 主分类号 G01R29/08
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