发明名称 |
METHOD FOR DIAGNOSING ABNORMALITY OF DEVICE |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide an abnormality diagnosing method for a device having a movable component, capable of grasping easily whether a condition of the device is normal or not (abnormal). SOLUTION: A raw waveform as to vibration of the device is normalized to find a normalized waveform. A data of the normalized waveform is fast- Fourier-transformed (FFT) to find a data of a frequency component, i.e., a power spectrum. A data as to vibration of the device under a normal condition is preliminarily found by the same manner. Abnormality diagnosis for the device is conducted based on a remaining power spectrum provided by subtracting a power spectrum in the normal contition from the power spectrum in the diagnosis.</p> |
申请公布号 |
JP2001318031(A) |
申请公布日期 |
2001.11.16 |
申请号 |
JP20000137079 |
申请日期 |
2000.05.10 |
申请人 |
TOKYO ELECTRIC POWER CO INC:THE;OKANO VALVE MFG CO |
发明人 |
MAKI AKIRA;NAWATA HIDEKI;TANAKA KOJI;KIDA YOSHIKATSU |
分类号 |
G01M99/00;G01H17/00;G05B23/02;(IPC1-7):G01M19/00 |
主分类号 |
G01M99/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|