发明名称 METHOD FOR DIAGNOSING ABNORMALITY OF DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide an abnormality diagnosing method for a device having a movable component, capable of grasping easily whether a condition of the device is normal or not (abnormal). SOLUTION: A raw waveform as to vibration of the device is normalized to find a normalized waveform. A data of the normalized waveform is fast- Fourier-transformed (FFT) to find a data of a frequency component, i.e., a power spectrum. A data as to vibration of the device under a normal condition is preliminarily found by the same manner. Abnormality diagnosis for the device is conducted based on a remaining power spectrum provided by subtracting a power spectrum in the normal contition from the power spectrum in the diagnosis.</p>
申请公布号 JP2001318031(A) 申请公布日期 2001.11.16
申请号 JP20000137079 申请日期 2000.05.10
申请人 TOKYO ELECTRIC POWER CO INC:THE;OKANO VALVE MFG CO 发明人 MAKI AKIRA;NAWATA HIDEKI;TANAKA KOJI;KIDA YOSHIKATSU
分类号 G01M99/00;G01H17/00;G05B23/02;(IPC1-7):G01M19/00 主分类号 G01M99/00
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