发明名称 Method and apparatus for forming a curved polyline on a radiation-sensitive resist
摘要 In a method for forming, with the aid of an electron beam (6), a polyline on a substrate (4) coated with a radiation-sensitive resist, the electron beam (6) is directed onto a surface of the substrate (4) in the direction of a Z coordinate, and the substrate (4) is displaced relative to the electron beam (6) in an X-Y plane in individual steps. After each individual step of the displacement, the electron beam (6) acts with a predefined energy input on the substrate (4) during a halt in the displacement motion. The energy input for each individual step is determined as a function of the shape of the polyline ascertained from several preceding individual steps. Also described is a corresponding apparatus with which, using electron beam lithography, it is possible to form polylines with a very uniform line width. The method and apparatus are particularly suitable for writing curved polylines.
申请公布号 US2001040221(A1) 申请公布日期 2001.11.15
申请号 US20010797861 申请日期 2001.03.05
申请人 PLONTKE RAINER;SCHUBERT ANDREAS;BLUME MICHAEL;STOLBERG INES 发明人 PLONTKE RAINER;SCHUBERT ANDREAS;BLUME MICHAEL;STOLBERG INES
分类号 G02B5/18;G03F7/20;G03F9/00;H01J37/304;H01J37/317;(IPC1-7):A61N5/00;G21G5/00 主分类号 G02B5/18
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