发明名称 METHOD AND APPARATUS FOR SPUTTER ETCH CONDITIONING A CERAMIC BODY
摘要 A method and apparatus for conditioning a surface of a ceramic body in a process chamber when the process chamber has a vacuum pump, an anode and a cathode. The conditioning method consists of pumping the process chamber down to a vacuum with the vacuum pump, introducing a gas into the chamber, energizing the anode and cathode with RF power to ignite the gas into a plasma, sputter etching the surface with ions from the plasma to remove contaminants therefrom. The method is accomplished either within a process chamber to condition, in situ, a ceramic chuck or within a cleaning chamber to condition any form of ceramic body or component.
申请公布号 US2001040091(A1) 申请公布日期 2001.11.15
申请号 US19980159009 申请日期 1998.09.23
申请人 KHURANA NITIN;BURKHART VINCE;SANSONI STEVE;PARKHE VIJAY;TZOU EUGENE 发明人 KHURANA NITIN;BURKHART VINCE;SANSONI STEVE;PARKHE VIJAY;TZOU EUGENE
分类号 C04B41/80;C23C14/34;C23F4/00;H01J37/32;H01J37/34;H01L21/203;H01L21/205;H01L21/302;H01L21/3065;H01L21/683;(IPC1-7):C23C14/34 主分类号 C04B41/80
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