发明名称 RELIABILITY AND FATIGUE CONTROL IN STRIP-LINE CIRCUITS
摘要 <p>The invention concerns testing strip-line circuits such as a module for a smart card and an electronic tag providing: a loop (B) formed with a strip section, said loop is engaged in an unwinding path consisting of a plurality of rollers (1 to 4); said loop is subjected to a fatigue cycle by travelling a predetermined number of turns at a predetermined unwinding speed, and after the cycle is over, the circuits of the loop are electrically tested.</p>
申请公布号 WO2001086252(A1) 申请公布日期 2001.11.15
申请号 FR2001001383 申请日期 2001.05.07
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